Typically, quality managers use Analyst to look for dependencies and correlations between contributing factors that influence final product quality. For example, using data from successive inspection stations, an analyst may study cause and effect throughout a production line.

SPC Data Collection Set Up
Preparing and maintaining data collection plans for an enterprise is a key task of the quality manager. With Analyst, you can concentrate on setup details at your desktop, rather than out on the production floor.

The Analyst package allows you to define your SPC data collection procedures, measurable product characteristics, and acceptable specification limits. Analyst can set up operator profiles to control menu access and screen formats, providing security and accountability. Flags and notes, which track assignable causes and corrective actions, may be pre-defined and customized.

Measurement Systems Analysis
The Automotive Industry Action Group (AIAG) has defined five categories of errors inherent in measurement systems: Repeatability, Reproducibility, Stability, Bias, and Linearity. Applied Stats Analyst has the features you need to characterize these types of errors in your system so that appropriate adjustments can be made. For example, gage R&R features can determine the capability of a measurement device to repeatedly reproduce consistent readings. Once consistent readings are assured, Analyst detects and reports biased readings or nonlinear responses, indicating if your measurement systems will deliver the precision your process needs.

Data Analysis & Report Tools
Two-variable scatter plots visually indicate correlations between any two measured parameters, such as plotting a process temperature vs. a final dimension. Analyst also provides linear regression analysis coefficients indicating correlation strength. Pareto, Histogram and Audit Trail charts can be analyzed or printed reports can be generated. Box and Whiskers charts can be plotted for an entire data set or divided into user-defined intervals.

Individual data sets may be too large or too small to allow accurate detection and analysis of process variation. Analyst offers the capability to join multiple data sets or filter out subsets of collected data. From this active data set, summary statistics are immediately available, streamlining the analysis, and quickly determining root causes of variation.

Data Interfaces
Data Sources
> Microsoft structured storage
> ODBC from MSDE, Access,
> SQL Server, and Oracle

Storage and Output
> Microsoft structured storage
> ODBC to MSDE, SQL

Server, and Oracle
> DDE server
> ASCII text

Alarms, Actions and Setup Features
> Alarm Conditions
> Out of Specification
> Out of Control
> Configurable Western Electric Alarms
> Net Weight Specific
> Cpk/Ppk Below
> Communication Errors
> No Data Recorded

Actions
> Flags (Assignable causes)
> Notes (Corrective actions)
> Free-form Notes
> Option to require Flag/Note
> Event Log
> Application/File launch

Setup Features
> Setup Wizard
> Audit Trail
> Inspection auditing
> User/Group Security
> Configurable menu access
> Headers trace data
> Data Archiving
> Multimedia Notebooks
> 21 CFR Part 11 compliance
> Lot Analysis

SPC Control Charts and Analysis
Variables
> X-Bar / Range
> X-Bar / Standard Deviation
> X-Bar / Moving Range
> Moving X-Bar / Moving

Range
> Median/Range
> Trend
> Pre-Control
> 3-Way Control Charting
> 3-Way Individual Control

Charting
> Exponentially Weighted

Moving Average
> Net Weight/Average
> Net Weight/Label

Attributes
> p
> np
> c
> u
> Trend

Short Run
> Short Run X-bar / Range
> Short Run individual X / Moving

Range
> Target Charts

Analysis
> Gage R&R
> MSA - Linearity & Bias
> Histogram
> Pareto analysis
> Box and Whiskers
> Scatter Plot w/Regression Analysis
> Trend Analysis
> Summary
> Raw or Filtered Data
> Net Weight
> Lot Release Control
> Data Filters
> Printed or Electronic Reports

Statistical Calculations
Spread
> Minimum Value
> Maximum Value
> Range
> R-Bar / MR-Bar
> Standard Deviation
> S-Bar Estimated Standard Deviation

Normality
> Kurtosis
> Skewness
> Chi-Square
> Shapiro Wilk
> Johnson Transformation

Capability
> Cr
> Cp
> Cpk
> Cpm
> Cp Upper
> Cp Lower
> Z (upper spec limit)
> Z (lower spec limit)
> CNOMO standard
> RSD (relative std deviation)
> D1-9000
> Kruskal-Wallis

Performance
> Pr
> Pp
> Ppk
> % Non Conforming
> Parts per Million (ppm) defective

Applied Stats Analyst is used for remote viewing and analysis of the above Applied Stats systems across existing factory network.